In-situ TEM Study of Dislocation-Interface Interactions
نویسندگان
چکیده
In this chapter, we highlighted the in situ transmission electron microscope (TEM) observation of the interactions of dislocations with three types of interfaces: (i) twin boundaries in Cu; (ii) metallic interphase boundaries; and (iii) metal/ceramic interfaces. Interface structures, interface properties, and dislocation-interface interactions are characterized in a high-resolution TEM. These knowledge provided insights into the understanding of the physical properties of materials, developing materials modeling tools incorporating interface deformation physics, and designing materials with desired properties.
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